
Agilent B1542A
Ten Nanosecond Pulsed IV Parametric Test Solution
Proven, accurate high-k/SOI characterization by 10 nsec pulse width
Technical Overview
• Agilent B1500A – Semiconductor Device Analyzer
• Agilent 4156B/4156C – Precision Semiconductor Parameter Analyzer
• Agilent 4155B/4155C – Semiconductor Parameter Analyzer
• Agilent E5260A/E5270B – 8 slot Measurement Mainframe
Overview
State of the art semiconductor
processes continue to meet market
demands requiring smaller lithography,
faster switching times, and lower
power consumption. Accompanying
the transition to the 45 nanometer
node is the use of high-k gate dielec-
trics and silicon-on-insulator (SOI)
transistors. The Agilent B1500A is
well-positioned to act as the focal
point for the parametric character-
ization of these devices in laboratory
environments. Already possessing
superb dc measurement performance,
the B1500A with EasyEXPERT
software now supports a pulsed IV
measurement solution utilizing an
Agilent 81110A pulse pattern genera-
tor and Agilent DSO90604A/90404A/
90254A and DSO80000B/54850
series scopes that can characterize
MOSFETs with an unprecedented
gate pulse width of 10 nanoseconds.
Application Library on the B1500A
EasyEXPERT
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