• Measurement Circuit Mode
If your device has large resistance
in series, it may be necessary to
convert measured parallel capaci-
tance (Cp) and conductance (G)
values obtained by E5250A capaci-
tance compensation to the capaci-
tance (Cs) and resistance (Rs)
values of a series equivalent
circuit. Calculate as follows:
where
measurement frequency.
• Noise Reduction
If your test room is electrically
noisy, do the following:
–Surround your wafer prober with
complete shield to prevent outside
electrical noise from going in, and
use shorter measurement cables.
–Use longer integration time to
average measurement errors.
Using higher test signal (oscilla-
tion) level is also effective because
signal-noise ratio will be higher.
Set them appropriately in 4284A
Setup dialog box (Figure 10)
in ICS.
Conclusion
By using Agilent E5250A’s Matrix
Switch Modules with capacitance
compensation for the Agilent 4284A
LCR Meter, you can perform accurate
capacitance measurements. Combining
with Agilent 4155C/4156C Parameter
Analyzer and Agilent ICS enables you
to integrate a low cost automatic
parametric test system for efficient
and accurate characterization and
evaluation of multiple devices.
Note: The information contained in
this application note is also applica-
ble to the Agilent 4155A/4156A and
Agilent 4155B/4156B.
Table 1. Ordering Example
For more information about Agilent
Technologies semiconductor test products,
applications, and services, visit our website:
www.agilent.com/go/semiconductor
or you can call one of the centers listed
and ask to speak with a semiconductor
test sales representative.
For more information about other Agilent
test and measurement products, go to
www.agilent.com
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Fax: (65) 275 0387
Product specifications and descriptions in this
document subject to change without notice.
Copyright © 2000 Agilent Technologies
Printed in U.S.A. 11/00
5965-5658E
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