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Systems & Polarization Analysis
Agilent 8169A Polarization Controllers
Precise manual and remote adjustments of polarization state
Nine Save/Recall registers of SOP
Continuous auto scanning, tuning the SOP across the entire
Poincare sphere
Developing and manufacturing competitive, high-value components and
systems for today’s optical industries requires precise attention to
polarization sensitivity. The Agilent 8169A Polarization Controllers can help
by saving time, money and effort when measuring and working with
polarization sensitive devices.
Polarization sensitive devices include EDFAs, single-mode fiber, polarization
maintaining fiber, isolators, switches, lasers, couplers, modulators,
interferometers, retardation plates and polarizers. Device performance
will be affected by polarization-dependent efficiency, loss, gain and
polarization mode dispersion. These polarization phenomena enhance
or degrade performance depending on the application area, be it
communications, sensors, optical computing or material analysis.
An Important Part of a Measurement System
A polarization controller is an important building block of an optical test
system because it enables the creation of all possible states of polarization.
The polarized signal stimulates the test device while the measurement
system receiver monitors the test device’s responses to changing
polarization. Sometimes polarization must be adjusted without changing
the optical power. At other times, polarization must be precisely
synthesized to one state of polarization (SOP) and then adjusted to
another SOP according to a predetermined path.
Characterizing polarization effect of passive optical component
The Agilent 8169A Polarization Controller
The Agilent 8169A provides polarization synthesis relative to a built-in
linear polarizer. The quarter-wave plate and half-wave plate are
individually adjusted to create all possible states of polarization.
Predeterministic algorithms within the Agilent 8169A enable the
transition path from one state of polarization on the Poincare sphere to
another to be specified along orthogonal great circles. These features are
important because device response data can be correlated to specific
states of polarization input to the test device. PDL measurement of DWDM
components using the Mueller method is one of the main applications. The
Mueller method stimulates the test path with four precicely known states.
Precise measurement of the corresponding output intensities allows
calculation of the upper row of the Mueller matrix, from which PDL is in
turn calculated. This method is fast, and ideal for swept wavelength
testing of PDL.
Specifications
Specifications describe the instruments’ warranted performance over
the 0° C to +55° C temperature range after a one-hour warm-up period.
Characteristics provide information about non-warranted instrument
performance. Specifications are given in normal type. Characteristics are
stated in italicized type. Spliced fiber pigtail interfaces are assumed for all
cases except where stated otherwise.
Description Agilent 8169A
Operating Wavelength Range 1400 to 1640 nm
Insertion Loss
2,3
<1.5 dB
Variation over 1 full rotation <±0.03 dB3
Variation over complete wavelength range <±0.1 dB
Polarization Extinction Ratio
4
>45 dB (1530 to 1560 nm)
Characteristic >40 dB (1470 to 1570 nm)
>30 dB (1400 to 1640 nm)
Polarization Adjustment
Resolution
4
0.18° (360°/2048 encoder positions)
Fast axis alignment accuracy at home position
5,6
±0.2°
Angular adjustment accuracy: minimum step size ±0.09°
greater than minimum step size
5
<±0.5°
Settling time (characteristic) <200 ms
Memory Save/Recall registers 9
Angular repeatability after Save/Recall
5,6
±0.09°
Number of scan rate settings 2
Maximum rotation rate
6
360°/sec
Maximum Operating Input Power Limitation +23 dBm
Operating Port Return Loss (characteristic)
Total reflection – Individual reflections >60 dB
Power Requirements 48 to 60 Hz
100/120/220/240 Vrms
45 VA max
Weight 9 kg (20 lb)
Dimensions (H x W x D) 10 x 42.6 x 44.5 cm
3.9 x 16.8 x 17.5 in
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