Agilent Technologies E5500 Series Specifikace stáhnout pdf (Strana 2)

Table of Contents

1. Introduction

2. Making residual (two-port) measurements on

pulsed carriers

Residual measurement considerations

Hardware configuration

Step-by-step procedure

Example 1: Residual noise floor using an Agilent 83732B

as the source (non-pulsed carrier)

Example 2: Pulsed carrier noise floor using an Agilent

83732B as the stimulus source

Example 3: Residual measurement of an Agilent 8347A

amplifier

3. Making absolute phase noise measurements on

pulsed carriers

Absolute phase noise measurement considerations

Hardware configuration

Step-by-step procedure

Example 1: Absolute pulsed measurement—

Agilent 8663A versus Agilent 83732B

Using a microwave downconverter

Example 2: Absolute pulsed measurement using

a microwave downconverter—Agilent 8644B versus

Agilent 83732B

4. Making AM noise measurements on pulsed carriers

Measurement considerations

PRF filtering

Measurement calibration

Example 1: Agilent 83732B pulsed AM noise

measurement using the internal AM detector

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Agilent Technologies E5500 Series Specifikace Strana 2