Agilent Technologies J-BERT N4903B Uživatelský manuál stáhnout pdf (Strana 28)

PCIe 3.0 test Conclusions

1. Probing at pins of device not practical at PCIe 3.0 speeds of 8GT/s.

2. De-embedding may remove fixture effects and recover some jitter margin.

3. Voltage measurements more impacted by de-embedding noise compared

to jitter.

4. Calibration of the stressed eye for receiver test should minimize effect of

instrument noise.

5. Stressed eye for RX testing is referenced to the die pad for the receiver. TX

voltage and jitter parameters are generally referenced to the pin of the

device.

6. Calibration Channel is crucial for ensuring RX signal amplitudes are at the

proper level at the RX Die pad.

7. Advanced active probing required for PCIe 3.0 Protocol Analysis

8. Tools for full PCIe 3.0 TX and RX testing are available today.

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Agilent Technologies J-BERT N4903B Uživatelský manuál Strana 28