Agilent Technologies Agilent 8164A Uživatelská příručka Strana 113

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Power Tests Performance Tests
Agilent 81600B Tunable Laser Source Family, Fourth Edition 113
The wavelength is increased, preferably in 10 nm increments. For each
wavelength the associated SSE value is measured, extrapolated to 1 nm
bandwidth resolution and recorded.
At the end of the test, the TLS is set to its maximum specified wavelength.
Test Procedure - High Power output
Note: This test does not apply to 81600B #130
This test procedure is applicable to the:
It measures the SSE of the module at the outputs indicated.
1 Set up the equipment as shown in Figure 35:
Figure 35 Test Setup for Signal-to-Source Spontaneous Emission Test - High Power Output
2 If you are using the Agilent 81600B #200, #160, #150 or #140, connect
the fiber to the High Power output, Output 2. On the 8164A/B, set
<Optical Output> to <High Power (2)>.
Agilent 81600B #200, Output 2, High Power
Agilent 81600B #160, Output 2, High Power
Agilent 81600B #150, Output 2, High Power
Agilent 81600B #140, Output 2, High Power
Agilent 81600B #142 #003
Agilent 81600B #142
Agilent 81600B #132
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