Agilent Technologies 42A Specifikace stáhnout pdf (Strana 163)

163

Chapter 8: Theory of Operation

Zoom Chip Select Test. The Zoom Chip Select Test verifies that each of the

2GHz TimingZoom memory ICs are individually selectable for data upload. Test

data is acquired and stored in the TimingZoom FISO memory. The test data is

then uploaded from each FISO memory IC and compared with known good data.

Passing the Zoom Chip Select Test implies that each TimingZoom memory IC is

individually addressable to upload TimingZoom data.

1 2 ... 158 159 160 161 162 163 164 165 166 167 168

Logic Analyzer 1
Features 2
Service Strategy 2
Application 2
In This Book 4
Contents 5
General Information 9
Accessories 10
Specifications 11
Characteristics 12
Environmental Characteristics 12
Recommended Test Equipment 13
Preparing for Use 15
Power Requirements 16
Operating Environment 16
To inspect the module 16
To prepare the mainframe 17
Chapter 2: Preparing for Use 19
To install the module 26
To turn on the system 28
To test the module 28
To clean the module 29
Testing Performance 31
Test Strategy 32
Test Interval 32
Test Record Description 32
Test Equipment 32
Instrument Warm-Up 32
To Perform the Self-tests 33
Perform the self-tests 34
To Set Up the Test Connectors 35
Materials Required 35
Set up the equipment 38
5 Set up the oscilloscope 39
Test the ECL threshold 43
Test the 0 V User threshold 46
Test the next pod 47
QV 58
QV 58
-↓ .↓ /↓ 0↓ 64
Acquisition 66
6HWXS+ROG&RPELQDWLRQV 76
QV 76
QV 76
L↑ + M↑ 78
QV 93
QV 93
-↕ .↕ /↕ 0↕ 95
Connect the logic analyzer 102
Acquire the data 102
To Test the Multi-Card Module 105
Set up the logic analyzer 106
4 Set up the Trigger tab 108
5 Set up the Listing window 109
Verify the test signal 113
Data Pulse 114
Data Signal 114
Clock Signal 114
Setup Time 116
-↑ .↑ /↑ 0↑ 117
5 Verify the test data 118
Performance Test Record 121
Calibrating 125
Calibration Strategy 126
Troubleshooting 127
To use the flowcharts 128
Chapter 5: Troubleshooting 129
Troubleshooting Flowchart 1 129
Troubleshooting Flowchart 2 130
To run the self-tests 131
To exit the test system 132
To test the cables 133
• open channel 137
To test the auxiliary power 138
Replacing Assemblies 139
Tools Required 140
To remove the module 140
To replace the circuit board 142
To replace the module 143
To replace the probe cable 144
To return assemblies 145
Replaceable Parts 147
Replaceable Parts Ordering 148
Replaceable Parts List 149
Chapter 7: Replaceable Parts 150
Exploded View 151
Theory of Operation 153
Block-Level Theory 154
Self-Tests Description 158

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