Agilent Technologies 4285A Uživatelský manuál

Agilent 4284A/4285A Precision LCR Meter Family20 Hz to 1 MHz75 kHz to 30 MHzTechnical OverviewA new standard for precise component, semiconductor and

10SpecificationsAll specifications are common to the Agilent 4284A and Agilent 4285Aunless otherwise noted.Measurement functionsMeasurement parameters

11Agilent 4285A: standardRange AccuracyNormal V 5 mVrms to 2 Vrms ±(8% + 0.4 fm% + 1 mVrms)I 200 µArms to 20 mArms ±(8% + 1 fm% 40 µArms)Constant V 10

12Comparator functionTen bin sorting for the primary measurement parameter, IN/OUT for the secondary measurement parameter.Bin count: 0 to 999999List

13GeneralPower requirements 100 V/120 V/220 V ±10%, 240 V +5%/-10%, 47 Hz to 66 Hz.Power consumption 200 VAOperating temperature and humidity 0 °C

14Measurement time Time interval from a trigger command to the EOM (end of measurement) signal output at the handler interface port.Agilent 4284A sett

15q accuracy is given as: ±[(180/p) x (Ae/100)] (absolute degrees)where: 1. Ae= [A + (Ka+Kb+Kc) X 100]Additional error due to temperature:Multiply the

16Table 2. Kaand Kb: Impedance proportional factorsNotes: 1. fmis the test frequency in (Hz)2. |Zm| is the device’s impedance3. Vs is the test signal

17Figure 1. Baseline accuracy facto (4284A)(For additional accuracy information refer to the impedance accuracy equation on page 14.)Notes: 1. Test si

18Additional specifications (Agilent 4284A only)When measured value < 10 mΩ, |Z|, R, and X accuracy, which is described on page 14,is given as foll

19Table 3. Accuracy equationsSpecifications continued on page 20SpecificationsContinued from page 19

2Agilent precision LCR meter familyUtilize state-of-the art measurement technologies• 6-digits of resolution at any range• Basic accuracies of 0.05% (

20q accuracy is given as: ±[(180/p) x (Ae/100)] (absolute degrees)Note: 1. Ae= (An+ B) Additional error due to temperature:Multiply the measurement ac

21Figure 2. Accuracy equation (An) frequency and impedance range (4285A)Note: For additional accuracy information, refer to the impedance accuracy equ

AccessoriesThe Agilent 42841A is used with either the Agilent 4284A orAgilent 4285A for high dc current bias measurements.Agilent 42841A bias current

Temperature induced error of 42841A (40A configuration)23Supplemental characteristics data forthe 42841AImpedance measurement accuracy and applicable

Test fixturesAgilent 16047A24Agilent 16034G Agilent 16334ASurface mount device fixture Agilent 16034G/H test fixturesFrequency: ≤ 110 MHzMaximum DC b

25Agilent 16451BDielectic material test fixture Agilent 16451B dielectric test fixtureFrequency: ≤ 30 MHzFunction: Dielectric constant and dissipati

26Ordering information Agilent 4284A 20 Hz to 1 MHz precision LCR meterNote: No test fixture is supplied with the Agilent 4284A.Furnished accessory: p

Cabinet options (Agilent 4284A and Agilent 4285A)Option 4284A/4285A-907: Front handle kitOption 4284A/4285A-908: Rack mount kitOption 4284A/4285A-90

www.agilent.comFor more information on Agilent Technologies’ products, applications or services, please contact your local Agilent office.The complete

3Satisfying your performance needsAdapt instrument configurationsto fit your test needs• Internal voltage biasing up to ±40 Vdc3• High current biasing

Dissipation factor risedue to high ac signal4Versatile componentmeasurementsCharacterize inductive devices• Sweep high current conditions• Identify de

C-V characteristicssample—MOS diode5Adaptable parameter testingDiscover new material properties• High accuracy and precise measurements• Wide frequenc

6Production testReduce production test factors• Increase test throughputThe precision LCR meter family reduces testing costs by providing accurate hig

7Comprehensive incoming inspectionSatisfying difficulties and requirements of impedance measurements during incoming inspectionMany types of measureme

8User friendly InterfaceSimple front panel operation• Clearly view the display• See all instrument settings• Interactive softkeys for simple controlDi

9Testing with the proper toolsMeasure the components’ performance in your power supply• Test your components under load conditions• Bias inductive dev