Agilent Technologies 8133A Servisní příručka stáhnout pdf (Strana 47)

Testing Performance 3

16800 Series Portable Logic Analyzers Service Guide 47

3 Set the sampling mode.

a Select the Sampling tab of the Analyzer Setup dialog.

b Select State - Synchronous Sampling.

c Set the Trigger Position to 100% Poststore.

d Set the Acquisition Depth to 128K.

e Clear the Timing Zoom check box to turn Timing Zoom

off.

f Ensure that the sampling speed is set to 250 MHz in

the Sampling Options box.

1 2 ... 42 43 44 45 46 47 48 49 50 51 52 ... 187 188

Agilent 16800 Series 1
Portable Logic Analyzers 1
Model Comparison 3
Features, Logic Acquisition 3
Features, Mainframe 4
Features, Pattern Generator 4
Supplied Accessories 4
Optional Accessories: 4
Service Strategy 4
In this Service Guide 6
4 Calibrating and Adjusting 8
7 Replaceable Parts 10
8 Theory of Operation 10
Contents 11
General Information 13
Accessories 14
Specifications 15
Characteristics 16
Non-Operating Environment 17
Dimensions 18
Recommended Test Equipment 19
1 General Information 20
Preparing for Use 21
To inspect the logic analyzer 22
To apply power 22
To clean the instrument 23
To start the user interface 23
To test the logic analyzer 23
2 Preparing for Use 24
Testing Performance 25
To perform the power-up tests 26
Logic Analyzer Test Strategy 27
3 Testing Performance 28
Testing Performance 3 31
Equipment Required 34
Perform System Self-Tests 36
Set Up the Test Equipment 37
Connect the Test Equipment 39
Deskew the oscilloscope 42
Set the 8133A pulse width 43
Configure the Logic Analyzer 45
Run eye finder 49
To re-align a stray channel 50
Test Pod 1 in 250 Mb/s Mode 52
Test Pod 2 in 250 Mb/s Mode 57
Test the remaining pods 59
Test Pod 1 in 500 Mb/s Mode 60
Test Pod 2 in 500 Mb/s Mode 64
Conclude the State Mode Tests 66
Performance Test Record 68
Calibrating and Adjusting 69
Calibration Strategy 70
Troubleshooting 71
Try , and then 75
Power Supplies 84
To run the self-tests 88
Bit#: 39 - 16 15 - 8 7 - 0 92
Clock Test 93
Simple RAM Test 93
RAM Persistence Test 94
Marching Bits RAM Test 94
Wait Test 94
Instruction Interrupt Test 95
To exit the test system 96
5 Troubleshooting 100
Set up the test equipment 101
Connect the test equipment 101
Threshold 102
Troubleshooting 5 109
Clock Frequency of 100 MHz 111
Click Run Rep 111
Replacing Assemblies 113
Replacement Strategy 114
Tools Required 114
To save the license file 115
To power off the system 116
Replacing Assemblies 6 117
6 Replacing Assemblies 118
600 watt power supply 119
Secondary power supply 120
60 mm fan 144
92 mm fans 145
Returning Assemblies 148
FRAGILE 149
Replaceable Parts 151
Ordering Replaceable Parts 152
System Replaceable Parts List 155
Replaceable Parts 7 159
• A — Assembly 163
• MP — Mechanical Part 163
• W — Cable 163
Theory of Operation 167
System Block Level Theory 168
Module Interface Board (MIB) 169
CPU Subsystem 170
PCI board 171
MIB (Module Interface Board) 171
Module Bus FPGA(s) 172
I/O FPGA 172
Theory of Operation 8 173
Front Panel Assembly 174
Power Up Routine 175
Product install 178
Software recovery methods 178
Self Test 179
Comparators 181
Acquisition IC 181
Master/Expander Connectors 182
Instruction Memory 183
Data Memory 183
Output Driver 184
Clock Circuit 184
CPU Interface 184

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